X-ray Diffraction

X-ray diffraction is a versatile, non-destructive analytical technique for identification and quantitative determination of the various crystalline forms, known as ‘phases’, of compounds present in powdered and solid samples. Identification is achieved by comparing the x-ray diffraction pattern – or ‘diffractogram’ – obtained from an unknown sample with an internationally recognized database containing reference patterns for more than 500,000 data sets.

Computer-controlled diffractometer systems use automatic routines to measure, record and interpret the unique diffractograms produced by individual constituents in even highly complex measures.

Results of an XRD measurement are presented in the form of a diffractogram showing phases present (peak positions), phase concentrations (peak areas), amorphous content (background hump) and crystallite size/strain (peak widths).

If you would like to find out more about X-Ray Diffraction or other technologies and services provided by American Assay Labs, please contact us and we'll be glad to assist you with your goals. « contact »



Excellence is an art won by training and habituation. We do not act rightly because we have virtue or excellence, but we rather have those because we have acted rightly. We are what we repeatedly do. Excellence, then, is not an act but a habit.

- Aristotle

The most important thing in communication is hearing what isn't said.

- Peter Drucker